You can only improve
what you can measure
That is why we keep adding to what can be measured, and put our ultimate effort in providing the best in both sensitivity and reproducibility for automated material metrology, ex situ and in situ.
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Latest News and Events
2025.04.07-09: CS International Conference 2025
Comme visit us in Belgium at the Compound Semiconductor International Conference!
2024.11.12-15: SEMICON EUROPA 2024
We are please to announce that this year we are showing off our flagship photoluminescence mapping system YWafer RD8 at the SEMICON EUROPA exhibition in Munich.
Booth C1 800, see you there!
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2024.04.16-17: CS International Conference 2024
Comme visit us in Belgium at the 14th Compound Semiconductor International Conference!
2023.12.10: A new configuration to our work horse YWafer GS4
Since 2006 this model, which covers up to 100x100 mm area measurement for PL, reflectivity, transmission and even curvature measurement has always been available in desktop YWAFER-GS4 (54x54 cm footprint) or full (desk included to support external laser sources) YWAFER-GS4-DESK formats. Now we are proud to be able to offer a compromise between the compact desktop version and the all-included desk version: YWAFER-GS4-ELBASE, which keeps the same extremely compact footprint of the desktop version, but in a stand-alone design wich contains all the electronics and the control PC.
2021.11.20: Thank you for visiting us at CS International 2021
I was a pleasure to give a talk and discuss our research and development here at YSystems with so many experts in the field. For those who could not attend, here is the entirepresentation.
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